TPM-Fail: New Vulnerabilities in Trusted Platform Module 2.0 Threaten Billions of IoT and Enterprise Devices
Trusted Platform Module (TPM) 2.0 is a widely used security standard that offers cryptographic services to secure various hardware and software applications. It has been implemented in billions of Internet of Things (IoT) and enterprise devices, providing secure storage and processing of cryptographic keys, among other functions.
However, recent research has uncovered new flaws in the TPM 2.0 library that could pose significant security risks to billions of devices. These vulnerabilities, collectively known as "TPM-Fail," can be exploited by attackers to extract cryptographic keys and gain access to sensitive data.
In this blog post, we will delve into the details of these flaws and explore the potential impact on IoT and enterprise devices.
What is TPM-Fail?
TPM-Fail is a collection of vulnerabilities that affect the Trusted Computing Group's (TCG) TPM 2.0 specification. The vulnerabilities were discovered by a group of researchers from the National University of Singapore and the University of Michigan.
The researchers discovered that attackers could exploit a design flaw in the TPM 2.0 specification to recover private keys from the TPM. This is achieved through a technique called "chosen ciphertext attack" that allows attackers to manipulate the ciphertext in such a way that the decryption process reveals the secret key.
The researchers demonstrated that the attack could be carried out in various scenarios, including when the TPM is used to secure the BitLocker encryption feature in Microsoft Windows. The attack could also be carried out remotely if the attacker has access to the TPM's public key.
What is the impact of TPM-Fail?
The impact of TPM-Fail is significant, as the TPM 2.0 specification is widely used in IoT and enterprise devices. The vulnerabilities could allow attackers to extract cryptographic keys, which could then be used to access sensitive data stored on the device.
For example, in the case of BitLocker encryption, attackers could use the extracted key to decrypt the encrypted data and gain access to sensitive information. Similarly, if the TPM is used to secure payment systems or access control systems, the vulnerabilities could be exploited to gain unauthorized access.
The impact of TPM-Fail could be widespread, as the vulnerabilities affect many different devices and operating systems. The researchers tested the attack on various systems, including Windows 10, Windows 7, and Ubuntu 18.04.
What are the solutions to TPM-Fail?
The researchers who discovered TPM-Fail have notified the TCG of the vulnerabilities, and patches have been released to mitigate the risk. However, patching devices can be challenging, as many IoT devices do not have an easy way to apply patches.
The best way to mitigate the risk of TPM-Fail is to ensure that devices are using the latest version of the TPM specification and that they are configured securely. For example, devices should not use weak cryptographic algorithms, and they should be configured to use the TPM in the correct way.
It is also important to monitor devices for signs of compromise, such as unauthorized access or unusual network activity. This can help to detect attacks early and limit their impact.
Conclusion
TPM-Fail is a significant vulnerability that affects the TPM 2.0 specification. The vulnerabilities could be exploited by attackers to extract cryptographic keys and gain access to sensitive data stored on IoT and enterprise devices.
The impact of TPM-Fail could be significant, as the TPM 2.0 specification is widely used in many different devices and operating systems. It is important for organizations to ensure that they are using the latest version of the TPM specification and that they are configured securely.
While patches have been released to mitigate the risk of TPM-Fail, patching IoT devices can be challenging. Therefore, it is important to monitor devices for signs of compromise and to take proactive measures to secure them against attacks.

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